The Ellipsometer EL X-02C is an optical instrument, which measures the change of polarization of laser light after reflection at a surface with highest precision and accuracy.

The procedure stands out by the fact that high energetic radiation does without and doesn't destroy the units under measurement so contamination by radiation and protective measures are dropped.  

The Ellipsometer EL X-02C is especially useful for the measurement of submonolayers. Submonolayers are one atomic or molecular monolayers which do not cover the surface totally.

The sensitivity of the EL X-02C Ellipsometer is in a range that also a small number of molecules covering a surface are measured.

EL X-02C Ellipsometer is also capable for A.N.D.R.E.A. technique as new method for direct analysis of molecular reactions. Thus, it is measured the change of polarization of a laser beam caused by molecular reactions. The new method shows a much higher sensitivity and a shorter measurement time than conventional immunological assays such as ELISA tests. Secondary and tertiary antibodies as well as markers are not necessary anymore. The incubation time is in the magnitude of seconds or minutes and the actual measuring time is 2 seconds twice. The volume of required test liquides are only 1ml. Immunological research tests have been carried out successfully with antigens of different size and IgE antibodies.